/[eiffelstudio]/trunk/eweasel/tests/incr417/tcf
ViewVC logotype

Annotation of /trunk/eweasel/tests/incr417/tcf

Parent Directory Parent Directory | Revision Log Revision Log


Revision 87582 - (hide annotations)
Sat Oct 22 18:17:26 2011 UTC (8 years, 3 months ago) by dhollen
File size: 650 byte(s)
Added test incr417 for bug #17907, where correcting a VMFN error in a system
where one feature's type is a qualified anchored type causes the compiler to report
a spurious VEEN error.

1 dhollen 87582
2     test_name qat-spurious-veen
3     test_description After a VMFN error is reported because two inherited features have the same name, the type of one feature is a QAT, one of the features is made deferred. The compiler should then accept the classes, but instead reports a nonexistent VEEN error
4    
5     define ROUTINE_MARK "do"
6     copy_sub Ace $TEST Ace
7     copy_raw test.e $CLUSTER test.e
8     copy_sub test1.e $CLUSTER test1.e
9     copy_raw test2.e $CLUSTER test2.e
10     copy_raw test3.e $CLUSTER test3.e
11    
12     compile_melted
13     compile_result validity_error TEST3 VMFN
14    
15     define ROUTINE_MARK "deferred"
16     copy_sub test1.e $CLUSTER test1.e
17    
18     resume_compile
19     compile_result ok
20    
21     test_end
22    

Properties

Name Value
svn:eol-style native

  ViewVC Help
Powered by ViewVC 1.1.23