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Contents of /trunk/eweasel/tests/incr417/tcf

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Revision 87582 - (show annotations)
Sat Oct 22 18:17:26 2011 UTC (8 years, 3 months ago) by dhollen
File size: 650 byte(s)
Added test incr417 for bug #17907, where correcting a VMFN error in a system
where one feature's type is a qualified anchored type causes the compiler to report
a spurious VEEN error.

2 test_name qat-spurious-veen
3 test_description After a VMFN error is reported because two inherited features have the same name, the type of one feature is a QAT, one of the features is made deferred. The compiler should then accept the classes, but instead reports a nonexistent VEEN error
5 define ROUTINE_MARK "do"
6 copy_sub Ace $TEST Ace
7 copy_raw test.e $CLUSTER test.e
8 copy_sub test1.e $CLUSTER test1.e
9 copy_raw test2.e $CLUSTER test2.e
10 copy_raw test3.e $CLUSTER test3.e
12 compile_melted
13 compile_result validity_error TEST3 VMFN
15 define ROUTINE_MARK "deferred"
16 copy_sub test1.e $CLUSTER test1.e
18 resume_compile
19 compile_result ok
21 test_end


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svn:eol-style native

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